The occurrence of two electrodes being remelted from a single ingot has resulted in the rejection of defective ingots, with one deemed acceptable and the other rejected due to transverse cracks. This project aims to conduct a thorough root-cause analysis using data-driven methodologies. By analyzing relevant data points and patterns, we seek to identify the underlying factors contributing to the defects observed in the ingots. Through this data-driven approach, we aim to uncover insights that will inform corrective actions to prevent similar occurrences in the future and improve overall product quality.
